Relationship between critical current fluctuation of superconducting bicrystal junction and junction parameters

Critical current fluctuation of bicrystal junctions is estimated from the 1 /f flux noise of the superconducting quantum interference device (SQUID) at T = 77 K. The relationships between the current fluctuation and junction p arameters, such as critical current I, and resistance R, are obtained. The obtained parameter dependence can be well explained by using the parameter dependence of the resistance fluctuation reported by Marx and Gross [Appl. Phys. Lett. 70, 120 (1997)] and the relationship between I, and R obtained for the present junctions. The agreement indicates that the critical curren t fluctuation is correlated with the resistance fluctuation through the rel ationship between I, and R.