The effect of delocalization of donor states with increased donor concentra
tion in ZnSe was considered. This effect leads to the change of recombinati
on mechanism from donor-acceptor pair recombination to the recombination be
tween the donor band and localized acceptor states without tunneling. The c
ritical donor concentration for delocalization has been estimated to be N-e
r approximate to 5 x 10(16) cm(-3) for shallow donors with E-D = 30 meV and
N-er approximate to 2 x 10(17) and 5 x 10(17) cm(-3) for deeper donors wit
h E-D = 44 and 55 meV, respectively. The comparison of the proposed recombi
nation model with experimental results allows one to explain qualitatively
without contradiction, the observed behaviour of the near-band edge impurit
y recombination bands in intermediately doped compensated ZnSe : N samples.
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