Experimental results to fabricate Si-based light-emitting materials by Si a
nd N coimplantation into SiO2 films are reported. Intense photoluminescence
(PL) was observed from the implanted samples with and without annealing. T
he PL intensity varied with the increased annealing temperature and had a m
aximum at about 600 degrees C. The X-ray photoelectron spectroscopy (XPS) a
nd Fourier transform infrared (FTLR) spectra were used to characterised the
microstructures. It is suggested that the PL may originate from N-related
defects and/or Si-O-based species. (C) 1999 Elsevier Science B.V. All right
s reserved.