Use of quantitative convergent-beam electron diffraction in materials science

Methods for quantitative convergent-beam electron diffraction are outlined and some results of our applications of convergent-beam electron diffractio n are shown, with emphasis on quantitative analysis of crystal structures i n materials science. Examples of thickness measurements and determination o f lattice parameters are presented. Measurements of low-order structure fac tors to obtain information on bonding charge-density distributions are revi ewed, with examples from TiAl intermetallics. For non-centrosymmetric cryst als, a method to determine three-phase structure invariants is given. Deter mination of polarity is also discussed. Microsc. Res. Tech. 46:130-145, 199 9. (C) 1999 Wiley-Liss, Inc.