Hh. Tian et M. Atzmon, Comparison of X-ray analysis methods used to determine the grain size and strain in nanocrystalline materials, PHIL MAG A, 79(8), 1999, pp. 1769-1786
The Warren-Averbach (WA) analysis of X-ray Bragg-peak broadening, as well a
s simplified methods, are employed in the characterization of a set of nano
crystalline Fe powder samples with a wide range of grain sizes. In the WA a
nalysis. the hook effect present at short times is attributed to small-angl
e grain boundaries. A universal relationship between grain size and rms str
ain is observed for all samples. For subtraction of instrumental peak broad
ening, a parabolic relation is found to yield the closest approximation to
iterative convolution. Among the integral breadth methods, assuming that bo
th strain and grain size broadening result in a Cauchy peak shape yields th
e largest grain size and smallest strain. Assuming that both contributions
result in Gaussian peaks does the opposite, providing the closest approxima
tion of the WA volume-averaged grain size. The Scherrer equation shows fort
uitous agreement with the WA area-averaged grain size. The simplified metho
ds can lead to severe systematic errors when the peak shape varies between
samples.