Nano-undulations of nickel thin films on a substrate under compressive stress

Authors
Coupeau, C Colin, J Grilhe, J
Citation
C. Coupeau et al., Nano-undulations of nickel thin films on a substrate under compressive stress, PHIL MAG L, 79(8), 1999, pp. 497-501
Citations number
18
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHILOSOPHICAL MAGAZINE LETTERS
ISSN journal
09500839 → ACNP
Volume
79
Issue
8
Year of publication
1999
Pages
497 - 501
Database
ISI
SICI code
0950-0839(199908)79:8<497:NONTFO>2.0.ZU;2-W
Abstract
Nickel thin films on a substrate have been studied in situ by atomic force microscopy during deformation. Undulations have been observed on the debond ing regions, of very low amplitude and of periodicity of the order of 1 mu m Attempts are made to compare these experimental results with previous mod els of buckling instabilities of thin plates.