We present calculations of surface reflectivity and emission spectra for mu
ltilayer dielectric waveguides with a two-dimensional patterning of deep ho
les. The spectra are obtained using a scattering-matrix treatment to propag
ate electromagnetic waves through the structure. This treatment incorporate
s, in a natural way, the extended boundary conditions necessary to describe
external reflection and emission processes. The calculated spectra demonst
rate how such measurements can be used to obtain experimental information a
bout the waveguide photonic band structure, the coupling of scattering mode
s to external fields, and the field distribution within the waveguide. [S01
63-1829(99)15327-X].