The periodic lattice distortion (PLD) accompanying the charge-density-wave
(CDW) transition (at -60 degrees C) in the a phase of Sn on Ge(lll) has bee
n determined by combining the distinct sensitivities of low-energy electron
diffraction (LEED) and surface x-ray diffraction (SXRD). New LEED I-V data
combined with a SXRD analysis yield a significant lattice distortion. The
PLD accompanying the CDW transition is a 0.37-Angstrom vertical rippling of
the Sn atoms accompanied by a perpendicular (0.17 Iq) and parallel (0.12 A
ngstrom) distortion of the first-layer Ge atoms, consistent with a band Jah
n-Teller-like distortion. [S0163-1829(99)01128-5].