Ge/Si(100) island size distributions were monitored for coverages between 3
.5 and 14.0 monolayers at growth temperatures from 450 to 600 degrees C. Fe
atures in these distributions are correlated with characteristic island mor
phologies. The mean dome cluster size increased and the onset of island dis
location was delayed as the growth temperature increased. At 600 degrees C,
very large hut clusters are formed. This behavior is attributed to strain-
assisted alloying of the Ge clusters. Energy dispersive x-ray analysis conf
irms Si diffusion into the Ge clusters at 600 degrees C. An atomistic elast
ic model supports the interpretation that alloying is driven by strain ener
gy enhancement near the island perimeters.