Six-circle diffractometer for surface diffraction using an in-vacuum x-raydetector

Citation
M. Albrecht et al., Six-circle diffractometer for surface diffraction using an in-vacuum x-raydetector, REV SCI INS, 70(8), 1999, pp. 3239-3243
Citations number
14
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
REVIEW OF SCIENTIFIC INSTRUMENTS
ISSN journal
00346748 → ACNP
Volume
70
Issue
8
Year of publication
1999
Pages
3239 - 3243
Database
ISI
SICI code
0034-6748(199908)70:8<3239:SDFSDU>2.0.ZU;2-H
Abstract
We report on the design of a diffractometer, which offers improved capabili ties for x-ray experiments in ultrahigh vacuum. Its main features are (i) t he possibility to follow the evolution of diffraction spots in situ during adsorption or film deposition; (ii) the measurement of reflections at high exit angles, i.e., large perpendicular momentum transfer. This goal is achi eved by placing a movable x-ray detector inside the vacuum chamber. (iii) O ther surface analysis equipment, e.g., a low-energy electron diffraction or an electron energy analyzer can be moved in front of the sample and operat ed simultaneously with x-ray diffraction. (iv) A load lock system-currently in preparation-will allow the quick exchange of samples without breaking s ystem vacuum. In addition, a new design of the chi circle used for sample a lignment provides a compact, space-saving design of the diffractometer. (C) 1999 American Institute of Physics. [S0034-6748(99)02608-8].