We report on the design of a diffractometer, which offers improved capabili
ties for x-ray experiments in ultrahigh vacuum. Its main features are (i) t
he possibility to follow the evolution of diffraction spots in situ during
adsorption or film deposition; (ii) the measurement of reflections at high
exit angles, i.e., large perpendicular momentum transfer. This goal is achi
eved by placing a movable x-ray detector inside the vacuum chamber. (iii) O
ther surface analysis equipment, e.g., a low-energy electron diffraction or
an electron energy analyzer can be moved in front of the sample and operat
ed simultaneously with x-ray diffraction. (iv) A load lock system-currently
in preparation-will allow the quick exchange of samples without breaking s
ystem vacuum. In addition, a new design of the chi circle used for sample a
lignment provides a compact, space-saving design of the diffractometer. (C)
1999 American Institute of Physics. [S0034-6748(99)02608-8].