X-ray double crystal diffraction and Raman spectra measurements of AlP/GaPshort-period superlattices

Authors
Zhang, FJ Zhang, DJ Zhang, J Qi, J Wang, YY Liu, FM Gan, RJ
Citation
Fj. Zhang et al., X-ray double crystal diffraction and Raman spectra measurements of AlP/GaPshort-period superlattices, SEMIC SCI T, 14(8), 1999, pp. 727-730
Citations number
10
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
SEMICONDUCTOR SCIENCE AND TECHNOLOGY
ISSN journal
02681242 → ACNP
Volume
14
Issue
8
Year of publication
1999
Pages
727 - 730
Database
ISI
SICI code
0268-1242(199908)14:8<727:XDCDAR>2.0.ZU;2-6
Abstract
The growth quality and structure parameters of(AlP)(n)/(GaP)(n) short-perio d superlattices (n = 4, 6) grown by MOVPE using TMGa, TMA1 and PH3 were mea sured by x-ray double crystal diffraction. Based on this. Raman spectra of the samples were measured and analysed and they were studied by comparing w ith the Raman spectra of a GaP single crystal. For the samples, the double- phonon modes of the first-order Raman scattering all exist. Moreover. the s econd-order Raman scattering peaks are observed to exist.