Neutron reflectometry studies of thin films and multilayered materials

Neutron reflectometry is an important technique for studying the compositio n and structure of thin films and layered media on a nanometer scale. Neutr ons are particularly useful as probes of organic and magnetic materials sin ce the information that can be obtained is often unique. Furthermore, the f act that neutrons traverse relatively large distances in single crystalline materials, such as silicon, permit investigations in diverse sample enviro nments. The fundamental theoretical principles and experimental methodology of neutron reflectometry are presented, in addition to several illustrativ e examples of measurements relevant to polymer science, biology, electroche mistry, and magnetism.