Ballistic electron magnetic microscopy: Imaging magnetic domains with nanometer resolution

Citation
Wh. Rippard et Ra. Buhrman, Ballistic electron magnetic microscopy: Imaging magnetic domains with nanometer resolution, APPL PHYS L, 75(7), 1999, pp. 1001-1003
Citations number
14
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
75
Issue
7
Year of publication
1999
Pages
1001 - 1003
Database
ISI
SICI code
0003-6951(19990816)75:7<1001:BEMMIM>2.0.ZU;2-F
Abstract
A variation of ballistic electron emission microscopy has been developed to image magnetic structure in thin-film multilayers with nanometer resolutio n. In studies of nominally uncoupled Co/Cu/Co trilayer films, magnetic doma ins and domain-wall motion are readily observable with this technique. In t he Co/Cu/Co trilayer system magnetic domains are found to occur on an simil ar to 500-nm-length scale and less, while smaller-scale fluctuations in the ballistic electron transport properties of the system are found on an simi lar to 10 nm length scale. (C) 1999 American Institute of Physics. [S0003-6 951(99)03933-9].