Energy selective optically pumped stimulated emission from InGaN/GaN multiple quantum wells

Citation
Tj. Schmidt et al., Energy selective optically pumped stimulated emission from InGaN/GaN multiple quantum wells, APPL PHYS L, 73(5), 1999, pp. 560-562
Citations number
22
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
73
Issue
5
Year of publication
1999
Pages
560 - 562
Database
ISI
SICI code
0003-6951(19990803)73:5<560:ESOPSE>2.0.ZU;2-4
Abstract
Optically pumped stimulated emission (SE) from InGaN/GaN multiple quantum w ells (MQWs) grown by metalorganic chemical vapor deposition has been system atically studied as a function of excitation photon energy (E-exc) to furth er understand the origin of SE in these structures. Optically pumped SE was observed for excitation photon energies well below that of the absorption edge of the MQWs, indicating the states responsible for the soft absorption edge in these structures can efficiently couple carriers with the gain reg ion. "Mobility edge''-type behavior in the SE peak was observed as E-exc wa s varied. The effective mobility edge measured in these SE experiments lies similar to 110 meV above the main spontaneous emission peak and similar to 62 meV above the SE peak. Tuning the excitation energy below the mobility edge was found to be accompanied by a drastic increase in the SE threshold due to a decrease in the effective absorption cross section. The experiment al results indicate that the SE peak observed here has the same microscopic origin as the spontaneous emission peak, i.e., radiative recombination of localized states. (C) 1998 American Institute of Physics. [S0003-6951(98)00 931-0].