Optically pumped stimulated emission (SE) from InGaN/GaN multiple quantum w
ells (MQWs) grown by metalorganic chemical vapor deposition has been system
atically studied as a function of excitation photon energy (E-exc) to furth
er understand the origin of SE in these structures. Optically pumped SE was
observed for excitation photon energies well below that of the absorption
edge of the MQWs, indicating the states responsible for the soft absorption
edge in these structures can efficiently couple carriers with the gain reg
ion. "Mobility edge''-type behavior in the SE peak was observed as E-exc wa
s varied. The effective mobility edge measured in these SE experiments lies
similar to 110 meV above the main spontaneous emission peak and similar to
62 meV above the SE peak. Tuning the excitation energy below the mobility
edge was found to be accompanied by a drastic increase in the SE threshold
due to a decrease in the effective absorption cross section. The experiment
al results indicate that the SE peak observed here has the same microscopic
origin as the spontaneous emission peak, i.e., radiative recombination of
localized states. (C) 1998 American Institute of Physics. [S0003-6951(98)00
931-0].