Hot carrier induced picosecond dynamics of a vertical cavity surface emitting laser: Influence of transverse effects

Citation
Od. Mucke et M. Wegener, Hot carrier induced picosecond dynamics of a vertical cavity surface emitting laser: Influence of transverse effects, APPL PHYS L, 73(5), 1999, pp. 569-571
Citations number
8
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
73
Issue
5
Year of publication
1999
Pages
569 - 571
Database
ISI
SICI code
0003-6951(19990803)73:5<569:HCIPDO>2.0.ZU;2-V
Abstract
The interplay of carrier heating effects and transverse variations of the c arrier distribution functions has a significant influence on the ultrafast emission dynamics of semiconductor vertical cavity surface emitting lasers. This interplay can lead to dynamic overshooting and oscillations (here at 200 GHz) even for lasing on a single transverse and single longitudinal mod e. A simple equivalent model is a cavity containing the gain medium and a s aturable absorber. The numerical results can directly be compared with rece ntly published experiments. (C) 1998 American Institute of Physics. [S0003- 6951(98)03031-9].