Molecular level alignment at organic semiconductor-metal interfaces

Citation
Ig. Hill et al., Molecular level alignment at organic semiconductor-metal interfaces, APPL PHYS L, 73(5), 1999, pp. 662-664
Citations number
15
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
73
Issue
5
Year of publication
1999
Pages
662 - 664
Database
ISI
SICI code
0003-6951(19990803)73:5<662:MLAAOS>2.0.ZU;2-Z
Abstract
In order to clarify the electronic structure of metal-molecular semiconduct or contacts, we use photoemission spectroscopy to investigate the energetic s of interfaces formed by vacuum deposition of four different molecular thi n films on various metals. We find that the interface electron and hole bar riers are not simply defined by the difference between the work functions o f the metals and organic solids. The range of interface Fermi level positio ns is material dependent and dipole barriers are present at all these inter faces. The results demonstrate the breakdown of the vacuum level alignment rule at interfaces between these organic molecular solids and metals. (C) 1 998 American Institute of Physics. [S0003-6951(98)02831-9].