Growth of epitaxial beta-SiC films on silicon using solid graphite and silicon sources

Citation
Hk. Woo et al., Growth of epitaxial beta-SiC films on silicon using solid graphite and silicon sources, DIAM RELAT, 8(8-9), 1999, pp. 1737-1740
Citations number
23
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
DIAMOND AND RELATED MATERIALS
ISSN journal
09259635 → ACNP
Volume
8
Issue
8-9
Year of publication
1999
Pages
1737 - 1740
Database
ISI
SICI code
0925-9635(199908)8:8-9<1737:GOEBFO>2.0.ZU;2-4
Abstract
Epitaxial beta-SiC films have been grown on mirror-polished Si(111) substra tes using bias-assisted hot filament chemical vapor deposition at a substra te temperature of 1000 degrees C. A graphite plate was used as the carbon s ource, and the silicon source came from the silicon substrate itself. The g as phase in the system is hydrogen only. Atomic hydrogen produced by hot fi laments reacted with the graphite to form hydrocarbon radicals, which furth er reacted with the silicon substrate and deposited as beta-SiC. The effect of negative bias applied to the substrate is the key factor for epitaxial growth. Under the growth conditions without the negative bias applied, only polycrystalline beta-SiC was obtained. (C) 1999 Elsevier Science S.A. All rights reserved.