Possibility of measuring displacement with sub-nanometre accuracy by ring laser operating in lock-in regime

Authors
Son, JY Strilets, IA Chun, JH Shin, S Choi, YJ Lee, HS
Citation
Jy. Son et al., Possibility of measuring displacement with sub-nanometre accuracy by ring laser operating in lock-in regime, ELECTR LETT, 35(15), 1999, pp. 1258-1260
Citations number
5
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
ELECTRONICS LETTERS
ISSN journal
00135194 → ACNP
Volume
35
Issue
15
Year of publication
1999
Pages
1258 - 1260
Database
ISI
SICI code
0013-5194(19990722)35:15<1258:POMDWS>2.0.ZU;2-P
Abstract
The intensity difference between counterpropagating waves in ring lasers wi th back-reflection waves from external mirrors is analysed to enable a high ly accurate measurement of displacement to be obtained. The difference is e xpressed as a periodic function of the distances between the ring laser mir rors and their corresponding mirrors. The measurement accuracy attainable w ith the difference can be in the sub-nanometre range.