Modeling of gradients in elastic properties for acoustic microscopy characterizations

Citation
H. Nounah et al., Modeling of gradients in elastic properties for acoustic microscopy characterizations, EPJ-APPL PH, 6(3), 1999, pp. 237-242
Citations number
11
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS
ISSN journal
12860042 → ACNP
Volume
6
Issue
3
Year of publication
1999
Pages
237 - 242
Database
ISI
SICI code
1286-0042(199906)6:3<237:MOGIEP>2.0.ZU;2-L
Abstract
In order to allow non-destructive characterizations by acoustic microscopy, the materials presenting in their properties a gradient perpendicular to t he surface are modelled. The method consists in regarding the material as b uilt of a succession of homogeneous layers numerous enough for the acoustic parameters to vary quasi-continuously. The gradient in Young modulus exist ing in the material is related to a gradient in acoustic properties measura ble by acoustic microscopy. The role of the shape of the gradient profile i s taken into account in the study of the convergence of the velocity of the surface mode V-S. The dispersion of the velocity V-S verses d/lambda (d is the depth of the gradient area and lambda is the wavelength) is studied as a function of the gradient profile. The shape of the curves shows that the best sensitivity to the profile is obtained for d/lambda approximate to 1.