A high-speed 32-channel CMOS VCSEL driver with built-in self-test and clock generation circuitry

Citation
Fe. Kiamilev et Av. Krishnamoorthy, A high-speed 32-channel CMOS VCSEL driver with built-in self-test and clock generation circuitry, IEEE S T QU, 5(2), 1999, pp. 287-295
Citations number
12
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Eletrical & Eletronics Engineeing
Journal title
IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS
ISSN journal
1077260X → ACNP
Volume
5
Issue
2
Year of publication
1999
Pages
287 - 295
Database
ISI
SICI code
1077-260X(199903/04)5:2<287:AH3CVD>2.0.ZU;2-3
Abstract
This paper describes the design, electrical, and optical test results for a high-speed 32-channel CMOS vertical-cavity surface emitting laser (VCSEL) driver integrated circuits with built-in self-test and clock generation cir cuitry. The circuit design and silicon parts are available to the research community through the Consortium for Optical and Optoelectronic Technologie s in Computing (CO-OP) and the Optoelectronics Industry Association (OIDA), This device is specifically targeted at users building VCSEL-based smart p hotonic system demonstrators. A ten-channel version of this driver chip is also available with the same functionality and performance.