Frequency following imaging of electric fields from resonant superconducting devices using a scanning near-field microwave microscope

Authors
Thanawalla, AS Feenstra, BJ Hu, WS Steinhauer, DE Dutta, SK Anlage, SM Wellstood, FC Hammond, RB
Citation
As. Thanawalla et al., Frequency following imaging of electric fields from resonant superconducting devices using a scanning near-field microwave microscope, IEEE APPL S, 9(2), 1999, pp. 3042-3045
Citations number
9
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY
ISSN journal
10518223 → ACNP
Volume
9
Issue
2
Year of publication
1999
Part
3
Pages
3042 - 3045
Database
ISI
SICI code
1051-8223(199906)9:2<3042:FFIOEF>2.0.ZU;2-3
Abstract
We have developed a scanning near-field microwave microscope that operates at cryogenic temperatures. Our system uses an open-ended coaxial probe with a 200 mu m inner conductor diameter and operates from 77 to 300 K in the 0 .01-20 GHz frequency range. In this paper, we present microwave images of t he electric field distribution above a Tl2Ba2CaCu2O8 microstrip resonator a t 77 Ei, measured at several heights. In addition, we describe the use of a frequency-following circuit to study the influence of the probe on the res onant frequency of the device.