Arrays with YBa2Cu3O7-Josephson junctions in ramp-edge geometry and on bicr
ystal substrates were investigated. The ramp-edge Josephson junctions were
prepared in arrays of three, five and seven junctions in series and in a mi
xed array with a very large number of up two millions on one chip. First me
asurements are presented. On bicrystal substrates Josephson junctions were
prepared with up to 105 Josephson junctions in series. They show scaled cur
rent-voltage characterisitcs and clear Shapiro-steps under influence of mic
rowave radiation.