Long term stability of YBCO-based Josephson junctions

Authors
Vale, LR Ono, RH Talvacchio, J Forrester, MG Hunt, BD Dilorio, MS Yang, KY Yoshizumi, S
Citation
Lr. Vale et al., Long term stability of YBCO-based Josephson junctions, IEEE APPL S, 9(2), 1999, pp. 3382-3385
Citations number
9
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY
ISSN journal
10518223 → ACNP
Volume
9
Issue
2
Year of publication
1999
Part
3
Pages
3382 - 3385
Database
ISI
SICI code
1051-8223(199906)9:2<3382:LTSOYJ>2.0.ZU;2-9
Abstract
We report on a study of long term aging in three different types of YBa2Cu3 O7-x Josephson junctions. Junction aging will affect the choices made in in tegrating this technology with actual applications. The junction types used in this study are (a) Go-doped barrier edge SNS junctions, (b) noble-metal SNS step-edge junctions, and (c) bicrystal junctions which are either unpa ssivated or passivated in situ with a normal metal shunt or an epitaxial in sulator. While all the junctions show degradation, for some the long term s urvival rate is encouraging.