Citation
M. Maruyama et al., Improvement of the sandwich junction properties by planarization of YBCO films, IEEE APPL S, 9(2), 1999, pp. 3456-3459
Citations number
8
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY
ISSN journal
10518223
→ ACNP
Volume
9
Issue
2
Year of publication
1999
Part
3
Pages
3456 - 3459
Database
ISI
SICI code
1051-8223(199906)9:2<3456:IOTSJP>2.0.ZU;2-F
Abstract
We have improved the properties of c-axis-oriented YBCO/PBCO/YBCO trilayer
junctions using planarization of YBCO films. The root-mean-square value of
the film roughness reduces to less than 60% of that of an as-grown film. Th
e junctions made through the planarization exhibit RSJ-like current-voltage
characteristics even for 20-nm-thick PBCO interlayers. The characteristic
voltage is 0.16 mV at 50 K which is remarkably improved compared to that of
junctions without the planarization.