Citation
Ay. Tzalenchuk et al., A variable temperature scanning SQUID microscope, IEEE APPL S, 9(2), 1999, pp. 4115-4118
Citations number
9
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY
ISSN journal
10518223
→ ACNP
Volume
9
Issue
2
Year of publication
1999
Part
3
Pages
4115 - 4118
Database
ISI
SICI code
1051-8223(199906)9:2<4115:AVTSSM>2.0.ZU;2-F
Abstract
We present a design of a scanning SQUID microscope (SSM) operating in a tem
perature range between about 5 K (2 K with pumping) and 100 K.