Response properties at 2.525 terahertz using high-T-C Josephson junctions on silicon bicrystal substrates

Citation
J. Chen et al., Response properties at 2.525 terahertz using high-T-C Josephson junctions on silicon bicrystal substrates, IEEE APPL S, 9(2), 1999, pp. 4479-4482
Citations number
14
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY
ISSN journal
10518223 → ACNP
Volume
9
Issue
2
Year of publication
1999
Part
3
Pages
4479 - 4482
Database
ISI
SICI code
1051-8223(199906)9:2<4479:RPA2TU>2.0.ZU;2-Q
Abstract
Using high-T-c grain boundary Josephson junctions (GBJJs) made of YBa2Cu3O7 -delta deposited across silicon bicrystal boundary, we successfully demonst rated direct response at frequency as high as 2.525THz, and the operation t emperature up to 70K. Also, the effects of response on polarization of elec tromagnetic waves and the harmonic mixing properties are investigated. It i s found that there is no polarization dependence of the response for our hi gh-quality GBJJs, This result is favorable to the spectroscopy application. At frequency as high as 2.525THz, the high-order harmonic mixing at zero a nd finite bias voltage has been demonstrated.