Local J(c) distribution in superconducting oxide layer of Bi2Sr2CaCu2Ox/Agtapes

The relationship between critical current (I-c) and the thickness of oxide layer of Bi2Sr2CaCu2Ox(Bi-2212)/Ag composite superconductor has been studie d to clarify local critical current density (J(c)) distribution in the oxid e layer. The comparison of local J(c) (J(c)(local)) distribution of the sam ples prepared with and without PAIR (Pre-Annealing and Intermediate Rolling ) process gives an explanation for the large J(c) enhancement by PAIR proce ss J(c) of oxide layer within 2 mu m from Bi-2212/Ag interface exceeds 3.8x 10(5) Acm(-2) at 4.2 Ii, 10 T. No significant increase of J(c)(local) is co nfirmed in Bi-2212 layer below 2 mu m from the interface. However, J(c)(loc al) increases by performing PAIR process in the middle part of Bi-2212 laye r of 2-15 mu m from the interface. J(c)(local) is 2.4x10(5) Acm(-2) and 1.0 x10(5) Acm(-2) at the distance of 5 mu m and 10 mu m from the interface, re spectively. The results indicate that the large J(c) enhancement by PAIR pr ocess is assigned to higher J(c)(local) in this middle part. J(c) improveme nt in the part near the free surface is also achieved by PAIR process and c ontributes to high J(c).