Ion-beam milling of YBCO thin films and their characterization by time-resolved pump-probe method

Authors
Hangyo, M Nashima, S Kawamura, M Shikii, S Tonouchi, M
Citation
M. Hangyo et al., Ion-beam milling of YBCO thin films and their characterization by time-resolved pump-probe method, IEEE APPL S, 9(2), 1999, pp. 1952-1955
Citations number
6
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY
ISSN journal
10518223 → ACNP
Volume
9
Issue
2
Year of publication
1999
Part
2
Pages
1952 - 1955
Database
ISI
SICI code
1051-8223(199906)9:2<1952:IMOYTF>2.0.ZU;2-X
Abstract
YBCO films are exposed to Ar ion beams in order to obtain flat surfaces and they are characterized by the time-resolved reflection pump-probe method e xcited with femtosecond optical pulses. The amplitudes of the reflectivity change of the ion-beam processed films are smaller than that of the as-grow n one and the decay time decreases by the ion-beam etching. These results a re discussed in relation to the changes of the supercarrier density and the relaxation time of quasiparticles by the ion-beam milling.