M. Hangyo et al., Ion-beam milling of YBCO thin films and their characterization by time-resolved pump-probe method, IEEE APPL S, 9(2), 1999, pp. 1952-1955
YBCO films are exposed to Ar ion beams in order to obtain flat surfaces and
they are characterized by the time-resolved reflection pump-probe method e
xcited with femtosecond optical pulses. The amplitudes of the reflectivity
change of the ion-beam processed films are smaller than that of the as-grow
n one and the decay time decreases by the ion-beam etching. These results a
re discussed in relation to the changes of the supercarrier density and the
relaxation time of quasiparticles by the ion-beam milling.