S. Ohshima et al., Observation of vortex movement in oxide superconductors by means of the Bitter pattern technique, IEEE APPL S, 9(2), 1999, pp. 2187-2190
The high-resolution Bitter pattern technique has been used to observe vorte
x movement of oxide superconductors, Bi(2)Sr(2)CaCu(2)Oz (Bi2212). The Bitt
er pattern was observed in field-cooled (FC) and zero-field cooled (ZFC) ex
periments. We also examined vortex movement of the Bi2212 single crystal in
which transport current was applied parallel to the c plane, and a de magn
etic field applied normal to the c plane at the Ni decoration. The Ni decor
ation pattern was observed using a scanning electron microscope (SEM) and a
n atomic force microscope (AFM). Through observation of the Ni decoration p
attern, we can identify vortex movement. The vortices moved into the sample
on FC experiment, and the direction of vortex movement was approximately n
ormal to the edge of the sample. We also found the vortex movement in a lin
e under application of transport currents. They moved hopping among pinning
centers due to Lorentz force.