YBCO films with a high-quality in-plane texture have been grown on differen
t Ni, yttria-stabilized Zirkonia (YSZ) and Stainless Steel (SS) substrates
using a modified pulsed-laser deposition technique. A biaxially textured bu
ffer of YSZ grown by ion-beam-assisted deposition was employed as a templat
e for the YBCO film as well as a diffusion barrier. X-ray and TEM analyses
were employed to understand the growth mechanisms. For short Ni substrates
(10 x 10 mm), critical current densities J(c) up to 2 MA/cm(2) (at 77K, 0T)
were observed. Long YBCO coated samples with lengths up to 0.5 m were manu
factured on Ni tapes (10 mm wide) and tubes (r = 4-7 mm). Contactless measu
rements of the critical parameters were provided by a third-harmonic method
. By bending experiments of YBCO films with external strain loading, J(c) w
as found to be reversible in the range of strains between - 0.5 % and + 0.5
% under tension and compression, with a pronounced maximum under compressi
ve strains.