CeO2 buffer layers for YBCO: Growth and processing via sol-gel technique

Citation
E. Celik et al., CeO2 buffer layers for YBCO: Growth and processing via sol-gel technique, IEEE APPL S, 9(2), 1999, pp. 2264-2267
Citations number
13
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY
ISSN journal
10518223 → ACNP
Volume
9
Issue
2
Year of publication
1999
Part
2
Pages
2264 - 2267
Database
ISI
SICI code
1051-8223(199906)9:2<2264:CBLFYG>2.0.ZU;2-C
Abstract
In this study, the processing and growth mechanisms of CeO2 buffer layers w ere evaluated on Ni substrates for YBCO superconductor. The sol-gel techniq ue was utilized to produce buffer lavers from six different Ce based precur sor materials, The microstructure, phase composition and formation of buffe r layers were characterized by means of ESEM, SEM, EDS, XRD, pole figure XR D and DTA techniques. The results indicated that the CeO2 formation starts at temperature of 420 degrees C. It was found that the best crack free CeO2 thin films were obtained by using Ce(NO3)(3).6H(2)O and colloidal CeO2 bas ed precursor materials. Different anions and their concentrations also infl uenced the structure of thin films.