Phase-pure, large grained Nb3Sn films on sapphire substrates have been prep
ared by a tno-step process, The average gain size increased with the film t
hickness. Transport properties like the penetration depth, mean free path,
and critical current density have been investigated in relation to the micr
ostructure of the films. Measurements of the DC- and HF-magnetic field depe
ndent surface impedance were performed. Nonlinear surface resistance occurr
ed at field le, els above B-s = 25mT, and was related to extrinsic mechanis
ms, The relevance of weak coupling at gain boundaries decreased with increa
sing grain size. Thus heating at local defects was concluded to be the domi
nant limiting mechanism in large grained films. An intrinsic field limit of
B-cl = 140mT was found. The polycrystalline films showed a much lower resi
dual resistance and comparable power handling compared to high-quality epit
axial YBa2Cu3O7-delta-films.