M. Pannetier et al., Determination of vortex motion characteristics, effective thickness and dynamic resistance in very thin YBaCuO bilayer structures, IEEE APPL S, 9(2), 1999, pp. 2635-2638
In order to develop superconducting flux flow devices, we have measured the
electrical characteristics of microbridges made from bilayers comprised of
a conductive capping layer deposited on a very thin YBa2Cu3O7-delta film.
In the flux creep regime, these structures show a low and quasi-constant de
pinning-to-critical current ratio and a high maximum vortex velocity. As ex
pected from these features, the microbridges can be driven in the flux flow
regime in the vicinity of T-c. In the flux flow regime, surprisingly, the
dynamic resistance is not an increasing function of temperature and shows a
value which is in the range of the normal-state resistance at the onset of
the superconductive transition.