Quench characteristics in HTSC devices

Citation
T. Kiss et al., Quench characteristics in HTSC devices, IEEE APPL S, 9(2), 1999, pp. 1073-1076
Citations number
5
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY
ISSN journal
10518223 → ACNP
Volume
9
Issue
2
Year of publication
1999
Part
1
Pages
1073 - 1076
Database
ISI
SICI code
1051-8223(199906)9:2<1073:QCIHD>2.0.ZU;2-Z
Abstract
Quench dynamics in a YBCO HTSC film and a Bi-based small HTSC coil have bee n studied, While the stability margin of HTSC against a local disturbance w as very large, quench current was limited by a catastrophic temperature ris e originated from the nonlinear characteristic of Joule heating in HTSC, Th e crucial parameter for the quench becomes the nonlinear resistance in HTSC as a function of temperature and transport current. It has been shown that the dynamic characteristics of the quench in both the film and the coil ca n be described quantitatively by the simplified one-dimensional heat balanc e equation even though the time scales are different by more that six order s, i.e., several hundreds micro seconds for the film and several hundreds s econds for the tape coil.