We describe current transfer processes between a metallic matrix and superc
onducting filaments through high-resistance layers, using a simple model to
analyze current-voltage data of composite superconductors in terms of basi
c material parameters. Until recently, multifilamentary high Tc conductors
nearly always consisted of ceramic filaments embedded in a uniform metallic
matrix. This has changed with the introduction of highly resistive barrier
layers, aimed at reducing filament coupling under alternating-field condit
ions. While such layers indeed have significant effects on the AC loss prop
erties of the conductor, they also tend to complicate issues such as curren
t injection at terminals and current << healing >> around local filament de
fects. In order to gain a better understanding of these processes, we use a
simple and quantitative model which relates the barrier and matrix resisti
vity directly to a characteristic current transfer length. This relation ca
n be used to gain direct experimental access to the electrical barrier prop
erties. We illustrate its usefulness with typical data obtained on composit
e-sheathed Bi(2223) tapes.