An error correction technique for scan conversion-based transient digitizers

A statistical technique for the error correction of scan conversion-based t ransient digitizers is presented. The technique is based on the identificat ion of the error model and on the assessment of the related correction feas ibility. The identification of the error model is carried out for the charg e distribution on each column of the target diode matrix of the scan digiti zer through a suitable experimental procedure. The feasibility of the error correction is assessed on the basis of the statistical significance of the model identification by means of a decision-making procedure. A suitable i ndex is utilized to verify the likelihood of carrying out a significant cor rection. Furthermore, for scan digitizers having a reference offset generat or, a self-calibrating function based on the proposed technique is suggeste d. Finally, experimental results of the technique application to an actual scan conversion-based transient digitizer showing a significant error reduc tion are discussed.