A self-consistent method for X-ray diffraction analysis of multiaxial residual-stress fields in the near-surface region of polycrystalline materials.II. Examples

The application of the formalism for residual-stress gradient evaluation ba sed on the measuring principle of the scattering-vector method, which has b een derived in the first paper of this series [Genzel (1999). J. Appl. Crys t. 32, 770-778], is demonstrated by practical examples. Depending on the st atistical scattering of the experimental data, either biaxial or even triax ial residual-stress states may be analysed; the latter case yields self-con sistently the depth profiles of the in-plane stresses, sigma(11)(tau) and s igma(22)(tau), the normal stress component, sigma(33)(tau), as well as the strain-free lattice spacing, d(0)(hkl). The results obtained by this new ev aluation procedure are compared with those obtained by X-ray stress-gradien t analysis performed on the basis of the sin(2)psi method.