An improved goniometer head for high-temperature single-crystal X-ray diffraction

A reliable and inexpensive goniometer head has been designed. Its stability resulting from its compact construction, makes it very suitable for accura te measurements. Moreover, its space-saving design facilitates its applicat ion in X-ray data collection using charge-coupled device (CCD) detectors. T his head has been improved for high-temperature measurements and has been t ested by comparison of accurate K0.88Rb0.12TiOPO4 data collected both at ro om temperature and at 973 K on the same crystal. The excellent structure re sults obtained at 973 K during the 360 h of measurements prove the stabilit y of the goniometer head.