AlGaInAs/InP strained-layer quantum well lasers at 1.3 mu m grown by solidsource molecular beam epitaxy

Citation
P. Savolainen et al., AlGaInAs/InP strained-layer quantum well lasers at 1.3 mu m grown by solidsource molecular beam epitaxy, J ELEC MAT, 28(8), 1999, pp. 980-985
Citations number
21
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF ELECTRONIC MATERIALS
ISSN journal
03615235 → ACNP
Volume
28
Issue
8
Year of publication
1999
Pages
980 - 985
Database
ISI
SICI code
0361-5235(199908)28:8<980:ASQWLA>2.0.ZU;2-D
Abstract
AlxGayIn1-x-yAs/InP strained-layer multiple-quantum-well lasers emitting at 1.3 mu m have been grown by solid source molecular beam epitaxy, and the p erformance characteristics have been studied. The lasers contain 4, 5, or 6 compressively strained quantum wells in the active region. They exhibit lo w transparency current densities, high gain coefficients, and high characte ristic temperatures compared to conventional GaInAsP/InP quantum well laser s. The results show that desired lasing features can be achieved with relat ively simple layer structures if the doping profiles and waveguide structur es are properly designed and the material is grown to high structural perfe ction.