Although surface texturing is applied in various kinds of devices like sola
r cells and light-emitting diodes (LEDs), the scattering phenomena occurrin
g at textured surfaces have not been studied in detail yet. We present a no
vel technique which allows the measurement of the angular distribution of l
ight scattered at textured surfaces into a piece of semiconductor. It relie
s on an integrated detector, because the scattered light cannot, in general
, be detected externally. We give a detailed description of the main featur
es of this method, focusing on the reliability of the results. Using this t
echnique, we investigate the scattering at a surface textured by natural li
thography for the application in LEDs.