Backscattering by dielectric-loaded trihedral corners and application to permittivity measurements

Authors
Corona, P D'Agostino, F Ferrara, G Gennarelli, C Riccio, G
Citation
P. Corona et al., Backscattering by dielectric-loaded trihedral corners and application to permittivity measurements, MICROW OPT, 22(5), 1999, pp. 361-367
Citations number
13
Categorie Soggetti
Optics & Acoustics
Journal title
MICROWAVE AND OPTICAL TECHNOLOGY LETTERS
ISSN journal
08952477 → ACNP
Volume
22
Issue
5
Year of publication
1999
Pages
361 - 367
Database
ISI
SICI code
0895-2477(19990905)22:5<361:BBDTCA>2.0.ZU;2-M
Abstract
Explicit physical optics expressions for a field backscattered by triangula r trihedral corners having one internal face coated with a dielectric layer are derived and applied to develop a new high-frequency free-space techniq ue Sol determining the complex permittivity of dielectrics. (C) 1999 John W iley & Sons, Inc.