APPLICATION OF LASER MASS-SPECTROMETRY FOR TRACE ANALYSIS OF PLUTONIUM AND TECHNETIUM

Citation
G. Passler et al., APPLICATION OF LASER MASS-SPECTROMETRY FOR TRACE ANALYSIS OF PLUTONIUM AND TECHNETIUM, Kerntechnik, 62(2-3), 1997, pp. 85-90
Citations number
17
Categorie Soggetti
Nuclear Sciences & Tecnology
Journal title
ISSN journal
09323902
Volume
62
Issue
2-3
Year of publication
1997
Pages
85 - 90
Database
ISI
SICI code
0932-3902(1997)62:2-3<85:AOLMFT>2.0.ZU;2-5
Abstract
Resonance ionization mass spectrometry (RIMS) is a highly selective an d sensitive method for trace analysis of radiotoxic elements in enviro nmental, biological or technical samples. By multiple resonant laser e xcitation and ionization of the element under investigation, an extrem ely high element selectivity is achieved. Additionally, isotope select ivity is obtained by subsequent mass analysis in a magnetic, time-of;f light or quadrupole mass spectrometer which serves for efficient backg round suppression as well. High sensitivity results from the large opt ical cross sections in the photo-ionization process and the high detec tion efficiency for ions. The outstanding element selectivity of RIMS permits a simplification of the chemical separation method. RIMS has b een used for ultra-trace analysis of long-lived radioisotopes of Pu an d Tc in various samples. The detection limit determined experimentally is of the order of 10(6) atoms per sample. For some of the most impor tant long-lived radioisotopes, this value is distinctly below the radi ometric detection limit.