Nanostructured precipitates: Experimental versus exact theoretical SAXS profiles

Authors
Garrido, V Crespo, D Pineda, E Pradell, T Capitan, M
Citation
V. Garrido et al., Nanostructured precipitates: Experimental versus exact theoretical SAXS profiles, NANOSTR MAT, 12(5-8), 1999, pp. 649-652
Citations number
8
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
NANOSTRUCTURED MATERIALS
ISSN journal
09659773 → ACNP
Volume
12
Issue
5-8
Year of publication
1999
Part
B
Pages
649 - 652
Database
ISI
SICI code
0965-9773(199907)12:5-8<649:NPEVET>2.0.ZU;2-7
Abstract
Small Angle X-Ray Scattering is one of the few techniques suitable for the determination of the grain size distribution of nanostructured materials. A theoretical development has allowed us to determine the spatial self-corre lation function of such systems and thus the scattering profile associated with the grain size distribution in the SAXS spectra without supposing any specific shape in the precipitates and taking into account their impingemen t. It has been tested in the primary crystallization of the amorphous Fe73. 5Cu1Nb3Si17.5B5 giving excellent agreement with the experimental data. (C) 1999 Acta Metallurgica Inc.