Rk. Islamgaliev et al., Structure and optical properties of nanostructured germanium and silicon processed by severe plastic deformation, NANOSTR MAT, 12(5-8), 1999, pp. 919-922
The nanostructured Ge and Si processed by severe plastic deformation (SPD)
has been studied by various techniques. TEM, XRD, Raman scattering and phot
oluminescence measurements. The as-prepared samples are characterized by bo
th a small grain size and a specific defect structure of grain boundaries (
GB). Microstructural aspects of optical properties in nanostructured Ge and
Si are discussed. (C) 1999 Acta Metallurgica Inc.