Morphological characterisation of nanocrystals with layered structures

Citation
Dv. Szabo et D. Vollath, Morphological characterisation of nanocrystals with layered structures, NANOSTR MAT, 12(1-4), 1999, pp. 597-600
Citations number
3
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
NANOSTRUCTURED MATERIALS
ISSN journal
09659773 → ACNP
Volume
12
Issue
1-4
Year of publication
1999
Part
A
Pages
597 - 600
Database
ISI
SICI code
0965-9773(199907)12:1-4<597:MCONWL>2.0.ZU;2-Q
Abstract
Nanocrystalline compounds with layered structures such as MoS2, WS2, MoSe2, WSe2, SnS2, or ZrSe2 show interesting structural features. These particles are synthesised in a microwave plasma. The morphology of the particles is characterised by high resolution transmission electron microscopy. Dependin g on the parameters of the synthesis different morphologies are observed. T he size of the particles is in a range from 5 to 10 nm. Many odd shaped par ticles with bent lattice planes and varying distances between the planes ar e observed. Additionally, the lattice parameters differ from sizes found in crystals in the micrometer range. (C) 1999 Acta Metallurgica Inc.