Pd/n-Si and Pd/n-GaAs devices have been irradiated from high energy (simila
r to 100 MeV) heavy ions of Au7+ (gold) and Si7+ (silicon) to study the irr
adiation effects in these junction devices on semiconductor substrates. The
devices have been characterized from I-V and C-V studies for electronic fl
ow characterization. It has been found that the devices become high resisti
ve on the irradiation and the substrates change the conductivity type from
n- to p- on the irradiation of fluence of similar to 10(12)-10(13) ions/cm(
2). The change in conductivity type has been understood as a result of crea
tion of deep accepters on the irradiation. (C) 1999 Elsevier Science B.V. A
ll rights reserved.