High energy heavy ion irradiation in semiconductors

Citation
Pc. Srivastava et al., High energy heavy ion irradiation in semiconductors, NUCL INST B, 156(1-4), 1999, pp. 105-109
Citations number
10
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
ISSN journal
0168583X → ACNP
Volume
156
Issue
1-4
Year of publication
1999
Pages
105 - 109
Database
ISI
SICI code
0168-583X(199907)156:1-4<105:HEHIII>2.0.ZU;2-T
Abstract
Pd/n-Si and Pd/n-GaAs devices have been irradiated from high energy (simila r to 100 MeV) heavy ions of Au7+ (gold) and Si7+ (silicon) to study the irr adiation effects in these junction devices on semiconductor substrates. The devices have been characterized from I-V and C-V studies for electronic fl ow characterization. It has been found that the devices become high resisti ve on the irradiation and the substrates change the conductivity type from n- to p- on the irradiation of fluence of similar to 10(12)-10(13) ions/cm( 2). The change in conductivity type has been understood as a result of crea tion of deep accepters on the irradiation. (C) 1999 Elsevier Science B.V. A ll rights reserved.