Refractive properties of nuclear microfilters

Citation
As. Smolyanskii et al., Refractive properties of nuclear microfilters, NUCL INST B, 155(3), 1999, pp. 331-334
Citations number
12
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
ISSN journal
0168583X → ACNP
Volume
155
Issue
3
Year of publication
1999
Pages
331 - 334
Database
ISI
SICI code
0168-583X(199908)155:3<331:RPONM>2.0.ZU;2-3
Abstract
The characteristics of the light transmission (at the wavelengths 0.3-5 mu m) and refraction in the spectral region from 360 to 950 nm have been analy zed for xenon ion irradiated PolyEthyleneTerePhthalate (PET) films after th eir chemical treatment and further metallization. A correlation between mac rokinetics of the chemical treatment and changes in the optical properties of the nuclear microfilters formed has been found. Consecutive growth of th e refraction coefficient from 15-17% to 40-45% as well as lowering of the t ransmittance of the etched PET-films was accompanied by micropore formation . The absence of any spectral dependence of the refraction coefficient at t he wavelengths studied was observed in the Xe-ion irradiated and chemically treated PET-films. Surface metallization of the PET-films (silver) resulte d in a twofold increase of the refraction coefficients and changes slightly the character of the spectral dependence for refraction coefficient in the visible region of the optical spectrum. (C) 1999 Elsevier Science B.V. All rights reserved.