Fabrication of single-mode chalcogenide fiber probes for scanning near-field infrared optical microscopy

We fabricate scanning near-field optical microscope (IR-SNOM) probe tips ma de from singlemode chalcogenide fiber and test them using a standard SNOM s etup and free-electron laser. SEM micrographs, showing tips with submicrome ter physical dimensions, demonstrate the feasibility of the thermal micropi pette puller process used to create the tips. Topographical data obtained u sing a shear-force nearfield microscope exhibit spatial resolution in the r ange of 80 to 100 nm. Optical data in the IR (near 3.5 mu m), using the pro be tips in collection mode, indicate an optical spatial resolution of appro ximately lambda/15. (C) 1999 Society of Photo-Optical Instrumentation Engin eers. [S0091-3286(99)00108-7].