The effects of Gamma X-valley mixing in (AlAs)(n)(GaAs)(n) (001) superlatti
ces (SLs) on the electronic properties are theoretically investigated versu
s the SL period (n = 1 - 25) and the band offsets. The calculations are bas
ed on the empirical sp(3)s* tight-binding model, which includes only neares
t-neighbour interactions. The results show that the highest state of the va
lence band (VB) is always confined to the GaAs slabs, whereas the bottom st
ate of the conduction band (CB) shows different behaviours as it is sensiti
ve to band-mixing effects. It is due to these effects in the ultrathin-laye
r SLs (n less than or equal to 8) that the electrons become localized in th
e AlAs X-vaIley and the heterostructure becomes of type-II. Whereas, for th
ick-layer SLs (n greater than or equal to 9), the GaAs wells become complet
ely separated. As a result, the electrons are localized in the GaAs slabs a
nd the SL is of type-I. The estimated critical layer thickness is about 26
Angstrom (n(c)=9), which is consistent with the photoreflectance experiment
s. The valley-mixing effects are shown to be efficient only for small condu
ction band offset (CBO less than or equal to 200 meV) and are essential for
the existence of type-II behaviour. The relevance of our work to the photo
nic device applications is furtherly discussed.