Investigations of heavy ion tracks in polyethylene naphthalate films

The heavy ion beam (with fluence 3x10(8) ion/cm(2)) from a cyclotron has be en used for irradiation of thin polyethylene naphthalate (PEN) films. Laten t tracks in these polymeric films have been sensitized by UV radiation and then chemically etched in NaOH solution. The etching process parameters hav e been controlled by the electroconductivity method. After etching, paramet ers of samples have been examined by SEM and bubble point methods (Coulter( R) Porometer II instrument). Results have shown good quality of PEN track m embranes with pore sizes 111 the range: 0.1 - 0.5 mu m The described proced ure is known for thin polyethylene terephthalate (PET) films. Taking into c onsideration that PEN films have got better mechanical, thermal, gas barrie r as well as better chemical resistance properties in comparison with PET f ilms, the possibility of application-of such membranes is much wider.